Deposition of NdNiO3 thin films on Si(100) by radiofrequency sputtering.

Dépôt de couches minces de NdNiO3 sur Si(100) par pulvérisation cathodique.

Author(s) : LAFFEZ P., ZAGHRIOUI M., LACORRE P., BROUSSE T., MONOT I.

Type of article: Article

Summary

NdNiO3 thin films with metal-insulator transition were deposited by radiofrequency sputtering and subsequent annealing under oxygen pressure on silicon(100). The deposition parameters and annealing conditions were optimized. Reproductible metal-insulator transition were obtained at 147 K.

Details

  • Original title: Dépôt de couches minces de NdNiO3 sur Si(100) par pulvérisation cathodique.
  • Record ID : 2000-0024
  • Languages: French
  • Source: Vide - vol. 53 - n. 289
  • Publication date: 1998
  • Document available for consultation in the library of the IIR headquarters only.

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