EFFECT OF THE EXTERNAL ELECTROMAGNETIC FIELD ON SEMICONDUCTOR CRYOTHERMOMETERS.

[In Polish. / En polonais.]

Author(s) : ZAWADZKI M., SUJAK B.

Type of article: Article

Summary

INVESTIGATIONS INTO THE POSSIBLE MEASUREMENT OF CRYOTEMPERATURES IN ELECTROMAGNETIC FIELDS. RESULTS OF TEST ON THE MEASURING TECHNIQUE USED IN CRYOGENICS AND FOR THAWING BY MICROWAVES.

Details

  • Original title: [In Polish. / En polonais.]
  • Record ID : 1984-1364
  • Languages: Polish
  • Source: Chlodnictwo - vol. 18 - n. 5
  • Publication date: 1983
  • Document available for consultation in the library of the IIR headquarters only.

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