ShareSummary
The authors measure the relative permittivity and dielectric loss tangent of substrate materials for high-critical temperature superconducting films at 18-300 K and at 5-10 gigahertz using the cavity-resonator method. The materials measured are single crystals of magnesium oxide, lanthanum-aluminium oxide, yttrium-aluminium oxide, lanthanum-strontium-gadolinium oxide, neodymium-gadolinium oxide, sapphire, and zirconium dioxide ceramic.
Details
- Original title: Relative permittivity and dielectric loss tangent of substrate materials for high-critical temperature superconducting film.
- Record ID : 1993-0703
- Languages: English
- Source: J. Supercond. - vol. 4 - n. 4
- Publication date: 1991/08
- Document available for consultation in the library of the IIR headquarters only.
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A CONTACTLESS METHOD FOR MEASUREMENT OF THE CRI...
- Author(s) : CLAASSEN J. H., REEVES M. E., SOULEN R. J. Jr
- Date : 1991/04
- Languages : English
- Source: Rev. sci. Instrum. - vol. 62 - n. 4
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SUPERCONDUCTIVITY CHARACTERIZATION BY A MAGNETI...
- Author(s) : LONGO A. S., KUMAR B.
- Date : 1989/06
- Languages : English
- Source: J. Supercond. - vol. 2 - n. 2
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ALTERNATING CURRENT SUSCEPTIBILITY APPARATUS FO...
- Author(s) : XENIKOS D. G., LEMBERGER T. R.
- Date : 1989
- Languages : English
- Source: Rev. sci. Instrum. - vol. 60 - n. 5
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LOW-FIELD MICROWAVE MEASUREMENTS OF YBA(2)CU(3)...
- Author(s) : KARIM R.
- Date : 1988/03
- Languages : English
- Source: J. Supercond. - vol. 1 - n. 1
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BATTERY-POWERED CURRENT SUPPLY FOR SUPERCONDUCT...
- Author(s) : BRAY S. L., GOODRICH L. F., DUBE W. P.
- Date : 1989
- Languages : English
- Source: Rev. sci. Instrum. - vol. 60 - n. 2
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