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Relative permittivity and dielectric loss tangent of substrate materials for high-critical temperature superconducting film.

Author(s) : KONAKA T., SATO M., ASANO H., et al.

Type of article: Article

Summary

The authors measure the relative permittivity and dielectric loss tangent of substrate materials for high-critical temperature superconducting films at 18-300 K and at 5-10 gigahertz using the cavity-resonator method. The materials measured are single crystals of magnesium oxide, lanthanum-aluminium oxide, yttrium-aluminium oxide, lanthanum-strontium-gadolinium oxide, neodymium-gadolinium oxide, sapphire, and zirconium dioxide ceramic.

Details

  • Original title: Relative permittivity and dielectric loss tangent of substrate materials for high-critical temperature superconducting film.
  • Record ID : 1993-0703
  • Languages: English
  • Source: J. Supercond. - vol. 4 - n. 4
  • Publication date: 1991/08
  • Document available for consultation in the library of the IIR headquarters only.

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