Share

TEMPERATURE STABILIZED SAMPLE STAGE FOR THE INVESTIGATION OF HIGH CRITICAL TEMPERATURE SUPERCONDUCTORS BY SCANNING ELECTRON MICROSCOPY.

Author(s) : GROSS R.

Type of article: Article

Summary

THE SETUP ALLOWS PERFORMANCE OF MEASUREMENTS FROM 1.5 TO 300 K. THE SAMPLE CAN BE IRRADIATED DIRECTLY BY THE ELECTRON BEAM. THE SAMPLE TEMPERATURE CAN BE STABILIZED BY A TEMPERATURE CONTROL SYSTEM WITH A STABILITY OF TYPICALLY 1 MILLIK OVER THE WHOLE TEMPERATURE RANGE. THE INSTALLATION OF THE CRYOGENIC STAGE DOES NOT REQUIRE ANY MODIFICATION OF THE MICROSCOPE CHAMBER OR THE DETECTOR ARRANGEMENT FOR MOST TYPES OF SCANNING ELECTRON MICROSCOPES. THE SYSTEM IS WELL SUITED FOR SPATIALLY RESOLVED IMAGING OF THE SUPERCONDUCTING PROPERTIES OF HIGH CRITICAL TEMPERATURE FILMS SUCH AS CRITICAL CURRENT DENSITY OR CRITICAL TEMPERATURE.

Details

  • Original title: TEMPERATURE STABILIZED SAMPLE STAGE FOR THE INVESTIGATION OF HIGH CRITICAL TEMPERATURE SUPERCONDUCTORS BY SCANNING ELECTRON MICROSCOPY.
  • Record ID : 1990-1782
  • Languages: English
  • Source: Cryogenics - vol. 29 - n. 7
  • Publication date: 1989

Links


See other articles in this issue (7)
See the source

Indexing