Comparison of cryogenic temperature measurements inside and outside the piping.
Author(s) : SÜSSER M., WÜCHNER F.
Summary
The design of cryogenic facilities needs careful investigations of all components with regard to reliability and economy of the operation. Leak tightness is a fundamental necessity in cryogenics, because leaks may impair or even prevent the operation of the complete cryogenic facility. Allergic components in cryogenic systems can be temperature sensors which, depending on certain restrictions, can be installed in different ways. The in-tube installation represents a more accurate temperature measurement of the fluid compared with the on-tube installation. However, the in-tube installation is more crucial and risky due to the fact that the sensor feedthrough can leak.
Details
- Original title: Comparison of cryogenic temperature measurements inside and outside the piping.
- Record ID : 2006-0043
- Languages: English
- Source: Proceedings of the nineteenth International Cryogenic Engineering Conference. ICEC 19.
- Publication date: 2002/07/22
Links
See other articles from the proceedings (71)
See the conference proceedings
-
Fast cycle, wide temperature range alternating-...
- Author(s) : FERRARI H., CODNER G., RODRIGUEZ MELGAREJO D., LEVY P., ACHA C., BEKERIS V.
- Date : 1993/11
- Languages : English
- Source: Cryogenics - vol. 33 - n. 11
View record
-
Die Auswahl von Tieftemperaturfühlern für den E...
- Author(s) : SÜSSER M.
- Date : 2008/11/19
- Languages : German
- Source: Deutsche Kälte-Klima-Tagung: 2008, Ulm.
View record
-
STRUCTURAL AND TECHNICAL CHARACTERISTICS OF CRY...
- Author(s) : GMELIN E.
- Date : 1982/06
- Languages : German
- Source: Kälte + Klimatechnik (Die) - vol. 35 - n. 6
View record
-
Sintered diamond anvil high-pressure cell for e...
- Author(s) : AKAHAMA Y., KOBAYASHI M., KAWAMURA H., ENDO S.
- Date : 1993/07
- Languages : English
- Source: Rev. sci. Instrum. - vol. 64 - n. 7
View record
-
OXYGEN POINT CRYOSTAT FOR CALIBRATING STANDARD ...
- Author(s) : KRISHAN R., GUPTA J. K.
- Date : 1990/11
- Languages : English
- Source: Indian J. pure appl. Phys. - vol. 28 - n. 11
View record