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ELECTRICAL RESISTANCE MEASUREMENTS AT HIGH PRESSURE AND LOW TEMPERATURE USING A DIAMOND-ANVIL CELL.

Author(s) : SAKAI N., KAJIWARA T.

Type of article: Article

Summary

THE SAMPLE ASSEMBLY CONSISTING OF COPPER-PLATE ELECTRODES AND POLYMER FILM HAS BEEN USED FOR A MODIFIED TWO-PROBE METHOD. THE RESISTANCE MEASUREMENTS HAVE BEEN CARRIED OUT AT PRESSURES UP TO 25 GPASCAL AND TEMPERATURES DOWN TO 1.7 K USING A DIAMOND-ANVIL CELL DRIVEN BY HELIUM GAS. THIS METHOD HAS BEEN APPLIED TO INVESTIGATE THE PRESSURE-INDUCED PHASE TRANSITION IN IODINE AND SUPERCONDUCTING TRANSITION IN HYDROGENATED AMORPHOUS SILICON FILMS.

Details

  • Original title: ELECTRICAL RESISTANCE MEASUREMENTS AT HIGH PRESSURE AND LOW TEMPERATURE USING A DIAMOND-ANVIL CELL.
  • Record ID : 1983-0064
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 53 - n. 4
  • Publication date: 1982
  • Document available for consultation in the library of the IIR headquarters only.

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