Sintered diamond anvil high-pressure cell for electrical resistance measurements at low temperatures up to 50 Gpascals.
Author(s) : AKAHAMA Y., KOBAYASHI M., KAWAMURA H., ENDO S.
Type of article: Article
Summary
The apparatus has been designed to minimize the pressure shift during the cooling cycle from room temperature to 1.2 K. Pressure is calibrated using the pressure dependence of the superconducting transition temperature of bismuth to 50 Gpascals. The usefulness of the apparatus is demonstrated by electrical resistance and transition temperature measurements on selenium and zirconium up to 60 Gpascals.
Details
- Original title: Sintered diamond anvil high-pressure cell for electrical resistance measurements at low temperatures up to 50 Gpascals.
- Record ID : 1994-2109
- Languages: English
- Source: Rev. sci. Instrum. - vol. 64 - n. 7
- Publication date: 1993/07
- Document available for consultation in the library of the IIR headquarters only.
Links
See other articles in this issue (5)
See the source
Indexing
-
Themes:
Low-temperature physics;
Transport and handling of cryogenic fluids;
Cryogenics safety, instrumentation and metrology;
Superconduction - Keywords: Superconduction; Cryotemperature; Measurement; Bismuth; Critical temperature; Electrical resistance; Zirconium; Superconductor; Selenium; Pressure; High temperature
-
MEASURING TECHNIQUES USING LOW TEMPERATURE EFFE...
- Author(s) : ALBRECHT G., RICHTER J., HABERKORN W.
- Date : 1980
- Languages : German
View record
-
A new method of surface resistance measurement ...
- Author(s) : LIANG C., PHILLIPS L., SUNDELIN R.
- Date : 1993/07
- Languages : English
- Source: Rev. sci. Instrum. - vol. 64 - n. 7
View record
-
A PRECISION LOW TEMPERATURE RESISTIVITY MEASURI...
- Author(s) : SHEIKH A. W.
- Date : 1982
- Languages : English
- Source: Indian J. Cryog. - vol. 7 - n. 3
View record
-
VARIATION OF THE SUPERCONDUCTING PROPERTIES OF ...
- Author(s) : PANOVA G. H.
- Date : 1982
- Languages : Russian
- Source: Z. eksp. teor. Fiz. - vol. 82 - n. 2
View record
-
USE OF RF SQUID FOR ELECTRICAL RESISTANCE MEASU...
- Author(s) : ROMERO J., FLEISCHER T., HUGUENIN R.
- Date : 1990
- Languages : English
- Source: Cryogenics - vol. 30 - n. 2
View record