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GROWTH QUALITY AND CRITICAL CURRENT DENSITY OF SPUTTERED YBCO THIN FILMS.

Author(s) : SCHAUER W.

Type of article: Article

Summary

THIN YBCO FILMS HAVE BEEN DEPOSITED ONTO SINGLE CRYSTALLINE SUBSTRATES (ALUMINIUM OXIDE, MAGNESIUM OXIDE, MIXED STRONTIUM AND TITANIUM OXIDE, ZIRCONIUM OXIDE). MAXIMUM CRITICAL CURRENT DENSITY VALUES IN ZERO FIELD OF 5,000,000, 2,000,000, AND 900,000 A/CM2 AT 77 K HAVE BEEN MEASURED FOR FILMS ON STRONTIUM/TITANIUM OXIDE, ZIRCONIUM OXIDE AND MAGNESIUM OXIDE, RESPECTIVELY. ON RANDOMLY ORIENTATED ALUMINIUM OXIDE AND ZIRCONIUM OXIDE THE FILMS ARE PRINCIPALLY POLYCRYSTALLINE, RESULTING IN DEPRESSED CRITICAL CURRENT DENSITY VALUES. WITH DECREASING FILM THICKNESS, HIGH CRITICAL CURRENT DENSITY VALUES (2,000,000 A/CM2, 77 K) ARE OBSERVED. IN ULTRATHIN FILMS (D = 5 NM), CRITICAL CURRENT DENSITY DEGRADED (EG 350,000 A/CM2, 4.2 K) BUT REVEALED A MAGNETIC FIELD DEPENDENCE QUITE DIFFERENT FROM THAT FOR THICKER FILMS.

Details

  • Original title: GROWTH QUALITY AND CRITICAL CURRENT DENSITY OF SPUTTERED YBCO THIN FILMS.
  • Record ID : 1991-1954
  • Languages: English
  • Source: Cryogenics - vol. 30 - n. 7
  • Publication date: 1990

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