THE VAMAS INTERCOMPARISON OF CRITICAL CURRENT MEASUREMENTS IN SUPERCONDUCTING NIOBIUM-TIN WIRES.
Author(s) : TACHIKAWA K.
Type of article: Article
Summary
THE VERSAILLES AGREEMENT ON ADVANCED MATERIALS AND STANDARDS (VAMAS) TECHNICAL WORKING PARTY IN THE AREA OF SUPERCONDUCTING AND CRYOGENIC STRUCTURAL MATERIALS RECENTLY CARRIED OUT THE FIRST WORLD-WIDE INTERCOMPARISON OF CRITICAL CURRENT MEASUREMENT ON MULTIFILAMENTARY NIOBIUM-TIN WIRES. SAMPLES OF WIRE WERE SUPPLIED FROM EACH OF THE EEC, JAPAN AND USA. THE TOTAL NUMBER OF PARTICIPANT LABORATORIES WAS 24 (EEC 11, JAPAN 8 AND USA 5). THE PURPOSE OF THE INTERCOMPARISON WAS TO EXAMINE THE EFFECT OF VARIABLES, SUCH AS SPECIMEN MANUFACTURING PROCESS, HOLDER MATERIAL, MEASUREMENT CONDITIONS, ETC, ON THE SCATTER IN MEASURED CRITICAL CURRENT. THE PAPER OUTLINES THE PROCEDURE OF THE INTERCOMPARISON AND SUMMARIZES THE MAIN RESULTS.
Details
- Original title: THE VAMAS INTERCOMPARISON OF CRITICAL CURRENT MEASUREMENTS IN SUPERCONDUCTING NIOBIUM-TIN WIRES.
- Record ID : 1990-1794
- Languages: English
- Source: Cryogenics - vol. 29 - n. 7
- Publication date: 1989
Links
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Indexing
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Themes:
Cryogenics safety, instrumentation and metrology;
Superconduction - Keywords: Superconduction; Japan; EEC; Comparison; Measurement; Superconductor; Niobium; USA; Tin; Testing; Critical current
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CRITICAL CURRENT MEASUREMENTS OF NIOBIUM-TIN SU...
- Author(s) : GOODRICH L. F., BRAY S. L.
- Date : 1989
- Languages : English
- Source: Cryogenics - vol. 29 - n. 7
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- Date : 1994/11
- Languages : English
- Source: Cryogenics - vol. 34 - n. 11
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Toward standardization of critical-current meas...
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- Date : 1994
- Languages : Japanese
- Source: Cryogenics/ Cryog. Eng. - vol. 29 - n. 9
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- Author(s) : ITOH K., WADA H., TACHIKAWA K.
- Date : 1994
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- Source: Cryogenics/ Cryog. Eng. - vol. 29 - n. 11
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Comparison of the DC performance of various Nb3...
- Author(s) : WESCHE R., ROTH F., BRUZZONE P.
- Date : 2006/07/17
- Languages : English
- Source: Multiconference CryoPrague 2006 (9th Cryogenics 2006, ICEC 21, ICMC'06)
- Formats : PDF
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