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EXTENDING THE SHELF LIFE OF FRESH SWEET CORN BY SHRINK-WRAPPING, REFRIGERATION, AND IRRADIATION.

Author(s) : DEAK T.

Type of article: Article

Summary

CHEMICAL, PHYSICAL, SENSORY, AND MICROBIOLOGICAL CHANGES WERE MONITORED DURING STORAGE OF UNWRAPPED AND SHRINK-WRAPPED FRESH SWEET CORN AT 283 AND 293 K (10 AND 20 DEG C). WRAPPING ESSENTIALLY ELIMINATED MOISTURE LOSS AND RESULTED IN ELEVATED CARBON DIOXIDE AND DECREASED OXYGEN CONCENTRATIONS WITHIN PACKAGES. THESE EFFECTS, TOGETHER WITH REFRIGERATION MARKEDLY REDUCED THE CHANGES ASSOCIATED WITH SENESCENCE AND POST HARVEST DETERIORATION. THE INITIAL MICROBIAL POPULATION WAS EFFECTIVELY DECREASED BY TREATING THE WRAPPED CORN WITH 0.5 OR 1.0 KILOGRAY (COBALT 60) IRRADIATION.

Details

  • Original title: EXTENDING THE SHELF LIFE OF FRESH SWEET CORN BY SHRINK-WRAPPING, REFRIGERATION, AND IRRADIATION.
  • Record ID : 1988-1477
  • Languages: English
  • Publication date: 1987
  • Source: Source: J. Food Sci.
    vol. 52; n. 6; 1987.11-12; 1625-1631; 8 fig.; 7 tabl.; 22 ref.
  • Document available for consultation in the library of the IIR headquarters only.

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