IIR document

Investigation of method for measuring adhesion force of ice in nano/micro scale by using SPM.

Author(s) : MATSUMOTO K., AKAISHI M., TERAOKA Y., et al.

Type of article: Article, IJR article

Summary

Ice adhesion to a cooling solid surface occurs in many situations, and it causes many serious problems that can lead to economic losses. Therefore, it is necessary to clarify the mechanism of ice adhesion to a cooling surface. In past studies, the adhesion force of ice was reported to be strongly governed by the surface energy of the cooling solid surface. In consideration of this surface energy, it is essential to investigate the ice adhesion force on a nano/micro scale. However, very little research has been conducted in nano/micro scale. Thus, in this paper, by using a scanning probe microscope (SPM), the methods for measuring the ice adhesion force and contact area between the cooling solid surface and formed ice are proposed, and the optimal measurement conditions of the SPM are determined. Then, the validity and effectiveness of the method are clarified.

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Pages: 130-141

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Details

  • Original title: Investigation of method for measuring adhesion force of ice in nano/micro scale by using SPM.
  • Record ID : 30003224
  • Languages: English
  • Source: International Journal of Refrigeration - Revue Internationale du Froid - vol. 35 - n. 1
  • Publication date: 2012/01

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