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PRESSURE CONTACT PROBE FOR RESISTIVITY MEASUREMENTS IN THE TEMPERATURE RANGE 77-200 K.

Author(s) : TRITT T. M., EHRLICH A. C., DAVIS H. S.

Type of article: Article

Summary

THE AUTHORS HAVE DESIGNED AND BUILT A SAMPLE PROBE THAT IS PARTICULARLY WELL SUITED FOR MEASURING THE RESISTIVITY AND SUPERCONDUCTING TRANSITION TEMPERATURE OF BULK HIGH CRITICAL TEMPERATURE MATERIALS OF NONUNIFORM SHAPE, IN THE TEMPERATURE RANGE 77-200 K. THE PROBE USES SPRING-LOADED INDIUM PRESSURE CONTACTS AND ALLOWS ELECTRICAL CONTACT TO BE MADE WITHOUT ALTERING OR CONTAMINATING THE SAMPLE. THE RESISTIVITY AND CRITICAL TEMPERATURE OF A BULK SILVER DOPED YBACUO SAMPLE WAS MEASURED AND THE RESULTS COMPARED WITH THOSE FROM A MORE ELABORATE SAMPLE PROBE AND DEWAR SYSTEM.

Details

  • Original title: PRESSURE CONTACT PROBE FOR RESISTIVITY MEASUREMENTS IN THE TEMPERATURE RANGE 77-200 K.
  • Record ID : 1990-0536
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 60 - n. 5
  • Publication date: 1989
  • Document available for consultation in the library of the IIR headquarters only.

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